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NASAs software technology uses an Image Quality Indicator (IQI)-based model that can predict whether cracks of a certain size can be detected, as well as a model that can provide appropriate conditions to optimize x-ray crack detection setup. Because this modeling software can predict minimum crack sizes that can be detected by a particular X-ray radiography testing setup, users can test various setups until the desired crack detection capabilities are achieved (predicted) by the modeling system. These flaw size parameter models use a set of measured inputs, including thickness sensitivity, detector modulation transfer function, detector signal response function, and other setup geometry parameters, to predict the minimum crack sizes detectable by the testing setup and X-ray angle limits for detecting such flaws. Current X-ray methods provide adequate control for detection of volumetric flaws but do not provide a high probability of detection (POD), and crack detection sensitivity cannot be verified for reliable detection. This results in reduced confidence in terms of crack detection. Given that these cracks, if undetected, can cause catastrophic failure in various systems (e.g., pressure vessels, etc.), verifying that X-ray radiography systems used for NDE can detect such cracks is of the utmost importance in many applications.